Share Email Print
cover

Proceedings Paper

Radiation-hard, charge-coupled devices for the extreme ultraviolet variability experiment
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Extreme-Ultraviolet Variability Experiment (EVE) is a component of NASA's Solar Dynamics Observatory (SDO) satellite, aimed at measuring the solar extreme ultraviolet (EUV) irradiance with high spectral resolution, temporal cadence, accuracy, and precision. The required high EUV quantum efficiency (QE), coupled with the radiation dose to be experienced by the detectors during the five year mission (~1 Mrad), posed a serious challenge to the charge-coupled device (CCD) detectors. MIT Lincoln Laboratory developed the 2048 × 1024 pixel CCDs and integrated them into the detector system. The devices were back-side thinned and then back surface passivated using a thin, heavily boron-doped silicon layer grown by molecular beam epitaxy (MBE) at less than 450°C. Radiation-hardness testing was performed using the Brookhaven National Laboratory's National Synchrotron Light Source (BNL/NSLS). The MBE-passivated devices were compared against devices with back surfaces passivated with a silver charge chemisorption process and an ion-implant/furnace anneal process. The MBE devices provided both the highest QE at the required (-100°C) operating temperatures, and superior radiation hardness, exceeding the goals for the project. Several flight-ready devices were delivered with the detector system for integration with the satellite.

Paper Details

Date Published: 12 September 2007
PDF: 9 pages
Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 668604 (12 September 2007); doi: 10.1117/12.734371
Show Author Affiliations
Richard C. Westhoff, MIT Lincoln Lab. (United States)
Micheal K. Rose, Kollmorgen Electro-Optical (United States)
James A. Gregory, MIT Lincoln Lab. (United States)
Gregory D. Berthiaume, MIT Lincoln Lab. (United States)
John F. Seely, Naval Research Lab. (United States)
Thomas N. Woods, Univ. of Colorado, Boulder (United States)
Gregory Ucker, Univ. of Colorado, Boulder (United States)


Published in SPIE Proceedings Vol. 6686:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV
Oswald H.W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top