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Proceedings Paper

High-brightness tabletop soft X-ray lasers at high repetition rate: injection-seeding of solid target plasma amplifiers and other developments
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Paper Abstract

We have recently demonstrated high repetition rate tabletop lasers operating at wavelengths as short as 10.9 nm based on collisional transient excitation of ions in plasmas created by laser heating of solid targets. As a further step in the development of these lasers into very high brightness and fully coherent soft x-ray sources, we have demonstrated injection seeding of the amplifiers with high harmonic seed pulses. We report results of an experiment in which a 32.6 nm Ne-like Ti amplifier was used to amplify a seed pulse from the 25th harmonic of Ti:Sapphire into the gain saturation regime. Simultaneous amplification of the 27th harmonic at 30.1 nm was also observed. The seeded soft x-ray laser beam was measured to approach full spatial coherence. We have demonstrated that this scheme is scalable to shorter wavelengths and that is capable of producing extremely bright soft x-ray laser pulse with essentially full coherence.

Paper Details

Date Published: 8 October 2007
PDF: 8 pages
Proc. SPIE 6702, Soft X-Ray Lasers and Applications VII, 670202 (8 October 2007); doi: 10.1117/12.734285
Show Author Affiliations
J. J. Rocca, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
Y. Wang, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
B. M. Luther, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
M. Berrill, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
M. A. Larotonda, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
E. Granados, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
D. Alessi, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
D. Martz, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
F. Pedacci, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
D. Patel, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)
V. N. Shlyaptsev, Univ. of California Davis-Livermore (United States)
C. S. Menoni, NSF ERC for Extreme Ultraviolet Science and Technology and Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 6702:
Soft X-Ray Lasers and Applications VII
Gregory J. Tallents; James Dunn, Editor(s)

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