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Proceedings Paper

Photon-number discrimination using a semiconductor quantum dot, optically gated, field-effect transistor
Author(s): Eric J. Gansen; Mary A. Rowe; Marion B. Greene; Danna Rosenberg; Todd E. Harvey; Mark Y. Su; Sae Woo Nam; Richard P. Mirin
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Paper Abstract

We demonstrate photon-number discrimination using a novel semiconductor detector that utilizes a layer of self-assembled InGaAs quantum dots (QDs) as an optically addressable floating gate in a GaAs/AlGaAs δ-doped field-effect transistor. When the QDOGFET (quantum dot, optically gated, field-effect transistor) is illuminated, the internal gate field directs the holes generated in the dedicated absorption layer of the structure to the QDs, where they are trapped. The positively charged holes are confined to the dots and screen the internal gate field, causing a persistent change in the channel current that is proportional to the total number of holes trapped in the QD ensemble. We use highly attenuated laser pulses to characterize the response of the QDOGFET cooled to 4 K. We demonstrate that different photon-number states produce well resolved changes in the channel current, where the responses of the detector reflect the Poisson statistics of the laser light. For a mean photon number of 1.1, we show that decision regions can be defined such that the QDOGFET determines the number (0, 1, 2, or ≥3) of detected photons with a probability of accuracy ≥83 % in a single-shot measurement.

Paper Details

Date Published: 15 October 2007
PDF: 11 pages
Proc. SPIE 6771, Advanced Photon Counting Techniques II, 67710Y (15 October 2007); doi: 10.1117/12.734122
Show Author Affiliations
Eric J. Gansen, National Institute of Standards and Technology (United States)
Mary A. Rowe, National Institute of Standards and Technology (United States)
Marion B. Greene, National Institute of Standards and Technology (United States)
Danna Rosenberg, Los Alamos National Lab. (United States)
Todd E. Harvey, National Institute of Standards and Technology (United States)
Mark Y. Su, National Institute of Standards and Technology (United States)
Sae Woo Nam, National Institute of Standards and Technology (United States)
Richard P. Mirin, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 6771:
Advanced Photon Counting Techniques II
Wolfgang Becker, Editor(s)

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