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Proceedings Paper

Narrow-band x-ray polarizing filters
Author(s): A. Martindale; N. P. Bannister; K. D. M. Harris; G. A. Solan; S. P. Collins; Y. Champouret; V. K. Muppidi; G. W. Fraser; M. Roy
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Paper Abstract

We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS.

Paper Details

Date Published: 13 September 2007
PDF: 7 pages
Proc. SPIE 6686, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV, 66860X (13 September 2007); doi: 10.1117/12.734114
Show Author Affiliations
A. Martindale, Univ. of Leicester (United Kingdom)
N. P. Bannister, Univ. of Leicester (United Kingdom)
K. D. M. Harris, Cardiff Univ. (United Kingdom)
G. A. Solan, Univ. of Leicester (United Kingdom)
S. P. Collins, Diamond Light Source Ltd. (United Kingdom)
Y. Champouret, Univ. of Leicester (United Kingdom)
V. K. Muppidi, Cardiff Univ. (United Kingdom)
G. W. Fraser, Univ. of Leicester (United Kingdom)
M. Roy, Univ. of Leicester (United Kingdom)

Published in SPIE Proceedings Vol. 6686:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XV
Oswald H.W. Siegmund, Editor(s)

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