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Proceedings Paper

Effect of light level and photon noise on hyperspectral target detection performance
Author(s): Torbjørn Skauli; Rikke Ingebrigtsen; Ingebjørg Kåsen
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Paper Abstract

The performance of hyperspectral target detection is known to vary with the light level. To characterize this variation, the effect of synthetically varying the amount of light is studied, starting with real images. Camera calibration coefficients are divided out to obtain the number of detector photoelectrons corresponding to each radiance sample. It is then straightforward to scale down the photoelectron numbers to represent a camera with lower light throughput and introduce additional noise by drawing corresponding Poisson-distributed photoelectron values. To first order, the resulting data may alternatively be considered to represent the increase in noise expected from a reduction in scene illumination. Images are generated with reduction of the light level down to a fraction of a percent of the original image. Sample spectra are shown after correction to photoelectron count, and it is argued that this representation of the data is useful because it permits direct estimation of signal to noise ratio. Spectral anomaly detection is applied to original and modified images, and the variation of false alarm rate with reduction factor is characterized. The results indicate that photon noise is the dominating cause of false alarms. There is no clear sign of false alarm contributions from the actual background clutter down to the data limit of false alarm probability, about 10-6 per pixel.

Paper Details

Date Published: 12 September 2007
PDF: 9 pages
Proc. SPIE 6661, Imaging Spectrometry XII, 66610D (12 September 2007); doi: 10.1117/12.733930
Show Author Affiliations
Torbjørn Skauli, Norwegian Defense Research Establishment (Norway)
Rikke Ingebrigtsen, Norwegian Defense Research Establishment (Norway)
Ingebjørg Kåsen, Norwegian Defense Research Establishment (Norway)


Published in SPIE Proceedings Vol. 6661:
Imaging Spectrometry XII
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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