Share Email Print
cover

Proceedings Paper

Validation of radiometric standards for the laboratory calibration of reflected-solar Earth-observing satellite instruments
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Historically, the traceability of the laboratory calibration of Earth-observing satellite instruments to a primary radiometric reference scale (SI units) is the responsibility of each instrument builder. For the NASA Earth Observing System (EOS), a program has been developed using laboratory transfer radiometers, each with its own traceability to the primary radiance scale of a national metrology laboratory, to independently validate the radiances assigned to the laboratory sources of the instrument builders. The EOS Project Science Office also developed a validation program for the measurement of onboard diffuse reflecting plaques, which are also used as radiometric standards for Earth-observing satellite instruments. Summarized results of these validation campaigns, with an emphasis on the current state-of-the-art uncertainties in laboratory radiometric standards, will be presented. Future mission uncertainty requirements, and possible enhancements to the EOS validation program to ensure that those uncertainties can be met, will be presented.

Paper Details

Date Published: 26 September 2007
PDF: 13 pages
Proc. SPIE 6677, Earth Observing Systems XII, 667707 (26 September 2007); doi: 10.1117/12.733922
Show Author Affiliations
James J. Butler, NASA Goddard Space Flight Ctr. (United States)
B. Carol Johnson, National Institute of Standards and Technology (United States)
Joseph P. Rice, National Institute of Standards and Technology (United States)
Steven W. Brown, National Institute of Standards and Technology (United States)
Robert A. Barnes, Science Applications International Corp. (United States)


Published in SPIE Proceedings Vol. 6677:
Earth Observing Systems XII
James J. Butler; Jack Xiong, Editor(s)

© SPIE. Terms of Use
Back to Top