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Proceedings Paper

Measurement system for acquiring gain distribution of avalanche photodiodes at low gains
Author(s): Kenji Tsujino; Makoto Akiba; Masahide Sasaki
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Paper Abstract

A measurement system is described for acquiring the gain distributions of avalanche photodiodes (APDs) in a range of low average gain. The system is based on an ultralow-noise capacitive transimpedance amplifier to readout the charges generated in an APD. The low noise level of the readout circuit about 7 electrons at the sampling rate of 200 Hz enables us to characterize the gain distributions. The gain distribution of a commercial silicon (Si) APD measured at gain of 3.29 using this system is presented.

Paper Details

Date Published: 15 October 2007
PDF: 8 pages
Proc. SPIE 6771, Advanced Photon Counting Techniques II, 67710Z (15 October 2007); doi: 10.1117/12.733873
Show Author Affiliations
Kenji Tsujino, National Institute of Information and Communications Technology (Japan)
Makoto Akiba, National Institute of Information and Communications Technology (Japan)
Masahide Sasaki, National Institute of Information and Communications Technology (Japan)


Published in SPIE Proceedings Vol. 6771:
Advanced Photon Counting Techniques II
Wolfgang Becker, Editor(s)

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