Share Email Print
cover

Proceedings Paper

X-ray imaging and adaptive optics system for a 13.5nm telescope
Author(s): S. Kitamoto; Y. Ohkubo; M. Tsujimoto; T. Ogita; K. Saitoh; M. Morii; K. Sudoh; N. Gotoh; Y. Shishido; T. Shibata; E. Takenaka
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We are developing a normal incident X-ray telescope with an adaptive optics system in order to achieve an unprecedented high-angular-resolution. The primary mirror with a diameter of 80mm is a spherical shape with a focal length of 2000 mm, which was coated by Mo/Si multilayer. The secondary mirror is a deformable mirror with 55 mm diameter, which was also coated by Mo/Si multilayer. Optical lights from a pin-hole were measured by a wave-front sensor and used as a reference for a correction of the deformable mirror. All the components were installed in a vacuum chamber. A closed loop control with the wave front sensor and the deformable mirror was successfully performed in the telescope and we confirmed the correction of the wave front. The rms-deviation of a performed wave front from a target shape during the control was ~30 nm-rms, whereas it without control was more than ~80 nm-rms. A 13.5 nm X-ray from an electron impact X-ray source was imaged on a backside CCD installed on a focal plane. A mesh made by steel was installed in front of the X-ray source, whose pitch and wire-thickness are 500 micro-m and 50 micro-m. The image of this mesh by optical lights from the X-ray generator is detected by the CCD. The current image quality is ~2.4 arc-sec and this was comparable to a diffraction limit of an optical wave length with our 80mm primary mirror.

Paper Details

Date Published: 20 September 2007
PDF: 8 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668817 (20 September 2007); doi: 10.1117/12.733655
Show Author Affiliations
S. Kitamoto, Rikkyo Univ. (Japan)
Y. Ohkubo, Rikkyo Univ. (Japan)
M. Tsujimoto, Rikkyo Univ. (Japan)
T. Ogita, Rikkyo Univ. (Japan)
K. Saitoh, Rikkyo Univ. (Japan)
M. Morii, Rikkyo Univ. (Japan)
K. Sudoh, Rikkyo Univ. (Japan)
N. Gotoh, Rikkyo Univ. (Japan)
Y. Shishido, Rikkyo Univ. (Japan)
T. Shibata, Rikkyo Univ. (Japan)
E. Takenaka, Rikkyo Univ. (Japan)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top