Share Email Print
cover

Proceedings Paper

Characterization of Pt/C multilayer at 200 keV soft gamma-ray
Author(s): Yasushi Ogasaka; Tomonaga Iwahara; Takuya Miyazawa; Yoshihiro Fukaya; Naoki Sasaki; Keisuke Tamura; Yasufumi Kanou; Hideyo Kunieda; Koujun Yamashita
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Imaging observations by means of optics is crucially important, not only for its capability of spatially resolving astronomical objects, but also for its sensitivity superior to non-imaging experiments by orders of magnitude. In order to study feasibilities of reflective optics in soft gamma-ray region, we measured Pt/C multilayer and multilayer-supermirror at 200 keV. Angular dispersion is measured at wide range of incidence angle. The results showed that measured reflectivities agree well with model calculation using tabulated optical constants and roughness measured at 8.4, 30 and 60 keV. Possible configuration of soft gamma-ray telescope is discussed.

Paper Details

Date Published: 20 September 2007
PDF: 8 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880S (20 September 2007); doi: 10.1117/12.733614
Show Author Affiliations
Yasushi Ogasaka, Nagoya Univ. (Japan)
Tomonaga Iwahara, Nagoya Univ. (Japan)
Takuya Miyazawa, Nagoya Univ. (Japan)
Yoshihiro Fukaya, Nagoya Univ. (Japan)
Naoki Sasaki, Nagoya Univ. (Japan)
Keisuke Tamura, ISAS/JAXA (Japan)
Yasufumi Kanou, Nagoya Univ. (Japan)
Hideyo Kunieda, Nagoya Univ. (Japan)
Koujun Yamashita, Nagoya Univ. (Japan)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top