Share Email Print

Proceedings Paper

Dynamic force microscopy and x-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface
Author(s): Hitoshi Kato; Susumu Takemura; Atsuro Ishii; Yoshiyuki Takarai; Yohei Watanabe; Takeharu Sugiyama; Tomoyasu Hiramatsu; Noriyuki Nanba; Osamu Nishikawa; Masahiro Taniguchi
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H2SO4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.

Paper Details

Date Published: 11 September 2007
PDF: 8 pages
Proc. SPIE 6645, Nanoengineering: Fabrication, Properties, Optics, and Devices IV, 66451Z (11 September 2007); doi: 10.1117/12.733602
Show Author Affiliations
Hitoshi Kato, Kanto Gakuin Univ. (Japan)
Susumu Takemura, Kanto Gakuin Univ. (Japan)
Atsuro Ishii, Kanto Gakuin Univ. (Japan)
Yoshiyuki Takarai, Kanto Gakuin Univ. (Japan)
Yohei Watanabe, Kanto Gakuin Univ. (Japan)
Takeharu Sugiyama, Kanto Gakuin Univ. (Japan)
Tomoyasu Hiramatsu, Kanto Gakuin Univ. (Japan)
Noriyuki Nanba, Kanto Gakuin Univ. (Japan)
Osamu Nishikawa, Kanazawa Institute of Technology (Japan)
Masahiro Taniguchi, Kanazawa Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 6645:
Nanoengineering: Fabrication, Properties, Optics, and Devices IV
Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

© SPIE. Terms of Use
Back to Top