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Proceedings Paper

Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope
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Paper Abstract

We present an overview update of the metrologic approach to be employed for the segmented mirror fabrication for Constellation-X spectroscopy x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability. We find that all the needed metrics for the mirrors are in hand but that they are currently limited by the mounting of the mirrors themselves.

Paper Details

Date Published: 3 October 2007
PDF: 8 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668818 (3 October 2007); doi: 10.1117/12.733080
Show Author Affiliations
J. P. Lehan, Univ. of Maryland, Baltimore County (United States)
NASA Goddard Space Flight Ctr. (United States)
S. Owens, NASA Goddard Space Flight Ctr. (United States)
T. Hadjimichael, NASA Goddard Space Flight Ctr. (United States)
Ball Aerospace (United States)
M. Hong, NASA Goddard Space Flight Ctr. (United States)
Ball Aerospace (United States)
K.-W. Chan, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
T. T. Saha, NASA Goddard Space Flight Ctr. (United States)
P. Reid, Harvard-Smithsonian Ctr. for Astrophysics (United States)
W. W. Zhang, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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