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Proceedings Paper

Non-destructive evaluation (NDE) using multi-aperture DSPI system and fast Fourier transform method
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Paper Abstract

Digital speckle pattern interferometry (DSPI) and digital shearography (DS) are two independent whole-field non-contacting optical methods for nondestructive flaw detection and precision measurements. A multi-aperture arrangement in front the imaging lens provides the grid structure within the speckles to yield desired diffraction halos at the Fourier transform plane. A three aperture arrangement in front of the imaging system is proposed here to combine coherently three waves at the CCD plane and also to introduce spatial carrier fringes within the speckle. One of the apertures is used for imaging the object onto the CCD plane, the second aperture for introducing smooth reference wave, while the third aperture carries a small angle wedge plate to provide the shear. This method allows simultaneous phase evaluation of the out-of-plane displacement and its first order derivative (slope) by filtering the appropriate diffraction halos of the Fourier spectrum. In this paper, we describe a (1, N) phase shifting technique with fast Fourier transform (FFT) for non destructive evaluation (NDE) of quasi-dynamic behavior of objects subject to slowly varying loads. The prominent advantage of the technique is that, it requires only a single frame prior to the object deformation and N number of frames during the object deformation for NDE. Experimental results are presented on a honeycomb structure subjected to thermal load.

Paper Details

Date Published: 14 September 2007
PDF: 11 pages
Proc. SPIE 6671, Optical Manufacturing and Testing VII, 667115 (14 September 2007); doi: 10.1117/12.732772
Show Author Affiliations
Basanta Bhaduri, Indian Institute of Technology Madras (India)
N. Krishna Mohan, Indian Institute of Technology Madras (India)
M. P. Kothiyal, Indian Institute of Technology Madras (India)


Published in SPIE Proceedings Vol. 6671:
Optical Manufacturing and Testing VII
James H. Burge; Oliver W. Faehnle; Ray Williamson, Editor(s)

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