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Proceedings Paper

Estimation of incidence and reflection angles from passive polarimetric imagery: extension to out-of-plane scattering
Author(s): Anand Pamba; Vimal Thilak; David G. Voelz; Charles D. Creusere
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Paper Abstract

Passive polarimetric imagery conveys information that complements the information contained in intensity and spectral imagery. Passive polarimetric measurements have been exploited in many remote sensing applications such as shape extraction, surface inspection and object detection/recognition. In previous work Thilak et al. proposed an algorithm to estimate the index of refraction and view angle (object surface orientation) from multiple polarization images where the source position changes between measurements. That work relies on a specular polarimetric bidirectional reflectance distribution function (pBRDF) developed by Priest and Meier. The pBRDF incorporates a Mueller matrix that characterizes the polarized reflection properties of a target for any incident Stokes vector. The results in Thilak et al. assumed that scattering occurs in the plane of incidence, which means that the pBRDF matrix contains many zero elements. In this paper, we extend this work to an out-of-plane scattering geometry, which implies that the pBRDF matrix contains more non-zero elements. In the initial work presented here, a nonlinear optimization approach is utilized to estimate the incident and reflection angles from a single polarization measurement assuming knowledge of the surface index of refraction and azimuthal angle between source and receiver. The effectiveness of the proposed method is verified through computer simulation.

Paper Details

Date Published: 13 September 2007
PDF: 7 pages
Proc. SPIE 6682, Polarization Science and Remote Sensing III, 66820O (13 September 2007); doi: 10.1117/12.732649
Show Author Affiliations
Anand Pamba, New Mexico State Univ. (United States)
Vimal Thilak, New Mexico State Univ. (United States)
David G. Voelz, New Mexico State Univ. (United States)
Charles D. Creusere, New Mexico State Univ. (United States)


Published in SPIE Proceedings Vol. 6682:
Polarization Science and Remote Sensing III
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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