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Proceedings Paper

Demonstration of a two-color 320×256 quantum dots-in-a-well focal plane array
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Paper Abstract

In our research group, we develop novel dots-in-a-well (DWELL) photodetectors that are a hybrid of the quantum dot infrared photodetector (QDIP). The DWELL detector consists of an active region composed of InAs quantum dots embedded in InGaAs quantum wells. By adjusting the InGaAs well thickness, our structure allows for the manipulation of the operating wavelength and the nature of the transitions (bound-to-bound, bound-to-quasibound and bound-to-continuum) of the detector. Based on these principles, DWELL samples were grown using molecular beam epitaxy and fabricated into 320 x 256 focal plane arrays (FPAs) with Indium bumps using standard lithography at the University of New Mexico. The FPA evaluated was hybridized to an Indigo 9705 readout integrated circuit (ROIC) in collaboration with QmagiQ LLC and tested with a CamIRaTM system manufactured by SE-IR Corp. From this evaluation, we report the first two-color, co-located quantum dot based imaging system that can be used to take multicolor images using a single FPA. We demonstrated that we can operate the device at an intermediate bias (Vb=-1.25 V) and obtain two color response from the FPA at 77K. Using filter lenses, both MWIR and LWIR responses were obtained from the array at the same bias voltage. The MWIR and LWIR responses are thought to be from bound states in the dot to higher and lower lying states in the quantum well respectively. Temporal NEDT for the DWELL FPA was measured to be 80mK at 77K.

Paper Details

Date Published: 26 September 2007
PDF: 7 pages
Proc. SPIE 6678, Infrared Spaceborne Remote Sensing and Instrumentation XV, 66780T (26 September 2007); doi: 10.1117/12.732566
Show Author Affiliations
Eric S. Varley, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
David Ramirez, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Jay S. Brown, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Sang Jun Lee, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Andreas Stintz, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Michael Lenz, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Sanjay Krishna, Ctr. for High Tech Materials, Univ. of New Mexico (United States)
Axel Reisinger, QmagiQ LLC (United States)
Mani Sundaram, QmagiQ LLC (United States)


Published in SPIE Proceedings Vol. 6678:
Infrared Spaceborne Remote Sensing and Instrumentation XV
Marija Strojnik-Scholl, Editor(s)

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