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Proceedings Paper

Design of high sensitivity refractometer based on temperature independent TE and TM modes in open top ridge waveguides
Author(s): X. Dai; S. J. Mihailov; R. B. Walker; C. Chen; J. Albert
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Paper Abstract

A technique for creating a temperature insensitive refractometer that utilizes TE and TM modes in an open-top ridge waveguide design is presented. By using the TE mode resonance as a temperature reference, the relative shift of the TM mode can be monitored in order to measure the refractive index of liquids under test. Specifically, the device fabricated here produces a relative resonance shift of 1 pm for every 1×10-4 of measured index change, with a temperature sensitivity less than 0.2 pm/°C. To increase the sensitivity of these devices, a theoretical model is developed to investigate the performance of some potential waveguide structures. Relationships between the waveguide core size, refractive index distribution, as well as the relative evanescent sensitivity of TE and TM modes are examined.

Paper Details

Date Published: 12 October 2007
PDF: 6 pages
Proc. SPIE 6770, Fiber Optic Sensors and Applications V, 67700B (12 October 2007); doi: 10.1117/12.732536
Show Author Affiliations
X. Dai, Communications Research Ctr. (Canada)
S. J. Mihailov, Communications Research Ctr. (Canada)
R. B. Walker, Communications Research Ctr. (Canada)
C. Chen, Carleton Univ. (Canada)
J. Albert, Carleton Univ. (Canada)

Published in SPIE Proceedings Vol. 6770:
Fiber Optic Sensors and Applications V
Eric Udd, Editor(s)

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