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Proceedings Paper

Hard x-ray focusing by stacked Fresnel zone plates
Author(s): Irina Snigireva; Anatoly Snigirev; Viktor Kohn; Vyacheslav Yunkin; Maxim Grigoriev; Serguei Kuznetsov; Gavin Vaughan; Marco Di Michiel
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Paper Abstract

Stacking technique was developed in order to increase focusing efficiency of Fresnel zone plates at high energies. Two identical Si chips each of which containing Fresnel zone plates were used for stacking. Alignment of the chips was achieved by on-line observation of the moiré pattern from the two zone plates. The formation of moiré patterns was studied theoretically and experimentally at different experimental conditions. To provide the desired stability Si-chips with zone plates were bonded together with slow solidification speed epoxy glue. Technique of angular alignment in order to compensate a linear displacement in the process of gluing was proposed. Two sets of stacked FZPs were produced and experimentally tested to focus 15 and 50 keV X-rays. Gain in the efficiency by factor 2.5 was demonstrated at 15 keV. Focal spot of 1.8 μm vertically and 14 μm horizontally with 35% efficiency was measured at 50 keV. Forecast for the stacking of nanofocusing Fresnel zone plates was discussed.

Paper Details

Date Published: 20 September 2007
PDF: 11 pages
Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050G (20 September 2007); doi: 10.1117/12.732404
Show Author Affiliations
Irina Snigireva, European Synchrotron Radiation Facility (France)
Anatoly Snigirev, European Synchrotron Radiation Facility (France)
Viktor Kohn, Russian Research Ctr. Kurchatov Institute (Russia)
Vyacheslav Yunkin, Institute of Microelectronics Technology (Russia)
Maxim Grigoriev, Institute of Microelectronics Technology (Russia)
Serguei Kuznetsov, Institute of Microelectronics Technology (Russia)
Gavin Vaughan, European Synchrotron Radiation Facility (France)
Marco Di Michiel, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 6705:
Advances in X-Ray/EUV Optics and Components II
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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