Share Email Print

Proceedings Paper

Simbol-X: x-ray baffle for stray-light reduction
Author(s): G. Cusumano; M. A. Artale; T. Mineo; V. Teresi; G. Pareschi; V. Cotroneo
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Simbol-X, an hard X-ray mission proposed by a consortium of European laboratories, will operate on a broad energy range (0.570 keV) providing a large collecting area ( ~ 1500 cm2 at 1.5 keV and ~ 450 cm2 at 30 keV) and a good imaging capability over the entire energy range. Relying on two spacecrafts in a formation flight configuration, Simbol-X will use, for the first time, a 20 meters focal length X-ray concentrator with multilayers coated mirrors that efficiently focalize photons above 10 keV and enhance the sensitivity up to 70 keV. Thanks to a ray-tracing code, we simulated the Simbol-X optics performance and investigated the contamination at the focal plane caused by stray−light from diffuse cosmic X-ray background. A dedicated X-ray baffle is mandatory to minimize this contamination that otherwise, would strongly affect the telescope sensitivity. In this paper we investigate different X-ray baffle designs and show their efficiency in reducing the stray−light.

Paper Details

Date Published: 20 September 2007
PDF: 9 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880C (20 September 2007); doi: 10.1117/12.732304
Show Author Affiliations
G. Cusumano, INAF-IASF-Pa (Italy)
M. A. Artale, INAF-IASF-Pa (Italy)
T. Mineo, INAF-IASF-Pa (Italy)
V. Teresi, INAF-IASF-Pa (Italy)
G. Pareschi, INAF Osservatorio Astronomico di Brera (Italy)
V. Cotroneo, INAF Osservatorio Astronomico di Brera (Italy)

Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top