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Proceedings Paper

Development of ultrafast soft x-ray beamline at PALS and surface modification of solids by high-order harmonics
Author(s): Krzysztof Jakubczak; Tomáš Mocek; Jirí Polan; Pavel Homer; Bedrich Rus; I Jong Kim; Chul Min Kim; Gye Hwang Lee; Deuk Su Kim; Seung Beom Park; Yong Soo Lee; Tae Keun Kim; Chang Hee Nam; Vera Hajkova; Jaromir Chalupsky; Libor Juha
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Paper Abstract

We report on the development of ultrafast coherent soft X-ray beamline at the Prague Asterix Laser System (PALS) Research Center intended for interdisciplinary applications such as ablation and controlled surface modification of solid materials for a micro/nano-pattering, soft X-ray interferometry and holography for surface probing with nanometric resolution, and improvement of focusing optics for soft X-ray beams. The beamline is based on 1 kHz, tabletop, high-order harmonic generation (HHG) source capable to deliver fully coherent, tunable beam in the 13 - 40 nm spectral range. Ti:sapphire (810 nm, 1 kHz) laser pulses with a duration of 35 fs and energy 1.5 mJ have been focused into a gas jet or gas cell containing conversion medium (Ar). To achieve highly efficient HHG we will apply the technique of guided laser pulses and the two-color laser field. Results on the optimization of HHG near 21 nm are presented. The beamline consists of a tandem of two vacuum chambers: one for the HHG source and its diagnostics, and second for the application experiments. After completion, access to this new installation will be opened to external users. This table-top system will be complementary to the existing, high energy (~10 mJ) Ne-like Zn soft X-ray laser at 21.2 nm developed at PALS. We will also present the first experimental results on the structural surface modifications of various solid materials (i.e., PMMA - poly(methyl methacrylate); amorphous carbon) caused by a few shot exposure to the focused HHG beam at 21.6 nm.

Paper Details

Date Published: 8 October 2007
PDF: 7 pages
Proc. SPIE 6702, Soft X-Ray Lasers and Applications VII, 67020X (8 October 2007); doi: 10.1117/12.732149
Show Author Affiliations
Krzysztof Jakubczak, Institute of Physics/PALS Ctr. (Czech Republic)
Tomáš Mocek, Institute of Physics/PALS Ctr. (Czech Republic)
Jirí Polan, Institute of Physics/PALS Ctr. (Czech Republic)
Pavel Homer, Institute of Physics/PALS Ctr. (Czech Republic)
Bedrich Rus, Institute of Physics/PALS Ctr. (Czech Republic)
I Jong Kim, Korea Advanced Institute of Science and Technology (South Korea)
Chul Min Kim, Korea Advanced Institute of Science and Technology (South Korea)
Gye Hwang Lee, Korea Advanced Institute of Science and Technology (South Korea)
Deuk Su Kim, Korea Advanced Institute of Science and Technology (South Korea)
Seung Beom Park, Korea Advanced Institute of Science and Technology (South Korea)
Yong Soo Lee, Korea Advanced Institute of Science and Technology (South Korea)
Tae Keun Kim, Korea Advanced Institute of Science and Technology (South Korea)
Chang Hee Nam, Korea Advanced Institute of Science and Technology (South Korea)
Vera Hajkova, Institute of Physics/PALS Centre (Czech Republic)
Jaromir Chalupsky, Institute of Physics/PALS Centre (Czech Republic)
Libor Juha, Institute of Physics/PALS Centre (Czech Republic)


Published in SPIE Proceedings Vol. 6702:
Soft X-Ray Lasers and Applications VII
Gregory J. Tallents; James Dunn, Editor(s)

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