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Proceedings Paper

Optical tests of a space mechanism under an adverse environment: GAIA secondary mirror mechanism under vaccum and thermal controlled conditions
Author(s): Gonzalo Ramos Zapata; Antonio Sánchez Rodríguez; Tomás Belenguer Dávila; Eduardo Urgoiti; Argiñe Ramírez Quintana
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Paper Abstract

In this work, the optical evaluation of a mechanism for space applications under vacuum and temperature controlled conditions at the facilities of the Space Instrumentation Laboratory (LINES) of the Aerospace Technical Nacional Institute of Spain (INTA) is reported. The mechanism was developed by the Spanish company SENER to fulfill the high performance requirements from ESA technology preparatory program for GAIA Astrometric Mission; in particular, a five degrees of freedom (dof), three translations and two rotations positioning mechanism for the secondary mirror of the GAIA instrument. Both interferometric tests and autocollimator measurements have been combined in order to extract the information about the accuracy of the mechanism movements as well as their repeatability under adverse environmental conditions: vacuum and thermal controlled conditions, up to a 10-6mbar and 100K. The scope of this paper will cover the measurements concept selection, the presentation of verification activities, the results of such dedicated optical measurements, the correlation with the mechanical models and a brief description of the design process followed to meet the test requirements.

Paper Details

Date Published: 18 September 2007
PDF: 11 pages
Proc. SPIE 6671, Optical Manufacturing and Testing VII, 667117 (18 September 2007); doi: 10.1117/12.732048
Show Author Affiliations
Gonzalo Ramos Zapata, Instituto Nacional de Técnica Aeroespacial (Spain)
Antonio Sánchez Rodríguez, Instituto Nacional de Técnica Aeroespacial (Spain)
Tomás Belenguer Dávila, Instituto Nacional de Técnica Aeroespacial (Spain)
Eduardo Urgoiti, SENER (Spain)
Argiñe Ramírez Quintana, SENER (Spain)

Published in SPIE Proceedings Vol. 6671:
Optical Manufacturing and Testing VII
James H. Burge; Oliver W. Faehnle; Ray Williamson, Editor(s)

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