Share Email Print
cover

Proceedings Paper

Progress in x-ray optics development with formed glass and Si wafers
Author(s): R. Hudec; L. Pina; V. Semencova; M. Skulinova; A. Inneman; L. Sveda; M. Mika; R. Kacerovsky; J. Prokop; M. Cerny
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The precisely shaped glass sheets and Si wafers are generally considered as the most promising substrates for future large space astronomical X-ray telescopes. Both approaches have demonstrated promising results obtained in the course of last years. In this contribution, we report on continued systematic efforts and analysis in precise shaping of thin glass sheets as well as Si wafers. New results will be briefly presented and discussed. For Si wafers, recent efforts focus also on improving the intrinsic quality of the slices to better meet the high requirements of future space projects.

Paper Details

Date Published: 20 September 2007
PDF: 10 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668810 (20 September 2007); doi: 10.1117/12.731727
Show Author Affiliations
R. Hudec, Astronomical Institute (Czech Republic)
L. Pina, Ctr. of Advanced X-ray Technologies (Czech Republic)
Czech Technical Univ. Prague (Czech Republic)
V. Semencova, Ctr. of Advanced X-ray Technologies (Czech Republic)
Institute of Chemical Technology (Czech Republic)
M. Skulinova, Astronomical Institute (Czech Republic)
A. Inneman, Ctr. of Advanced X-ray Technologies (Czech Republic)
L. Sveda, Ctr. of Advanced X-ray Technologies (Czech Republic)
Czech Technical Univ. Prague (Czech Republic)
M. Mika, Institute of Chemical Technology (Czech Republic)
R. Kacerovsky, Institute of Chemical Technology (Czech Republic)
J. Prokop, Institute of Chemical Technology (Czech Republic)
M. Cerny, Institute of Rock Structure and Mechanics (Czech Republic)


Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top