Share Email Print
cover

Proceedings Paper

Qualitative characterization of YBa2Cu3O7-δ films using low spectral resolution Raman spectroscopy
Author(s): M. Branescu; I. Morjan; F. Dumitrache; I. Sandu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We describe our low spectral resolution Raman system that allows us to directly appreciate the quality of YBa2Cu3O7-δ (YBCO) films, obtained by pulsed laser deposition on LaAlO3 substrate. We identify the basic features of YBCO films' spectral fingerprints, validated by high spectral resolution analysis, described in previous reports. This fast and nondestructive valuable analytical tool functions at a convenient time and environment after deposition.

Paper Details

Date Published: 25 April 2007
PDF: 5 pages
Proc. SPIE 6606, Advanced Laser Technologies 2006, 660618 (25 April 2007); doi: 10.1117/12.729507
Show Author Affiliations
M. Branescu, National Institute of Materials Physics (Romania)
I. Morjan, National Institute for Laser, Plasma and Radiation Physics (Romania)
F. Dumitrache, National Institute for Laser, Plasma and Radiation Physics (Romania)
I. Sandu, National Institute for Laser, Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 6606:
Advanced Laser Technologies 2006

© SPIE. Terms of Use
Back to Top