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Proceedings Paper

Nanoscale linear measurements based on the attenuated total internal reflection: an interferometric approach
Author(s): Hristiyan Stoyanov
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Paper Abstract

In this paper we describe a simple interferometric phasemeter which can be used as a linear sensor. This method is based on the interferometric restoration of both p- and s-components of the resultant field. The phase shift between them as a function of the attenuation of the total internal reflection can be determined from the interference signal. A lateral fringe shift and contrast variations were observed during the measurements. To explain these effects a simple theory is proposed. The resulting interferometrical signal is studied experimentally.

Paper Details

Date Published: 5 March 2007
PDF: 5 pages
Proc. SPIE 6604, 14th International School on Quantum Electronics: Laser Physics and Applications, 66040R (5 March 2007); doi: 10.1117/12.726902
Show Author Affiliations
Hristiyan Stoyanov, Univ. of Sofia (Bulgaria)


Published in SPIE Proceedings Vol. 6604:
14th International School on Quantum Electronics: Laser Physics and Applications

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