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Proceedings Paper

3D digitising using structured illumination: application to mould redesign
Author(s): L. Granero; J. Sánchez; V. Micó; J. J. Esteve; J. Hervás; S. Simón; E. Pérez
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Paper Abstract

Conventional techniques applied to three dimensional (3D) acquisition of information has significant limitations depending on the features of the piece under test. Thus, complex curvatures, deeper concavities and higher volumes are some examples of critical factors in which contact digitising systems are not suitable to undertake such kind of task. In these cases, the usage of optical 3D digitization systems implies a more appropriate way to obtain 3D information about the sample. In particular, structured illumination by means of white light provides point-to-point object acquisition with accuracy and resolution that are always below the manufactured tolerances. Moreover, when the object under test is too large, structured illumination can be mixed with photogrammetrical techniques in order to avoid errors by means of the delimitation of the overall working volume. This proceeding presents several real cases applied to mould industry in which 3D shape measurement using white light structured illumination is combined with finite element method (FEM) and laser cladding techniques to allow the repair of the mould.

Paper Details

Date Published: 18 June 2007
PDF: 11 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66164B (18 June 2007); doi: 10.1117/12.726641
Show Author Affiliations
L. Granero, AIDO-Instituto Tecnológico de Óptica (Spain)
J. Sánchez, AIDO-Instituto Tecnológico de Óptica (Spain)
V. Micó, AIDO-Instituto Tecnológico de Óptica (Spain)
J. J. Esteve, AIDO-Instituto Tecnológico de Óptica (Spain)
J. Hervás, AIDO-Instituto Tecnológico de Óptica (Spain)
S. Simón, AIDO-Instituto Tecnológico de Óptica (Spain)
E. Pérez, AIDO-Instituto Tecnológico de Óptica (Spain)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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