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Proceedings Paper

Resistance non-uniformity correction method using bias heating for resistive type uncooled microbolometer FPAs
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Paper Abstract

This paper proposes a new resistance non-uniformity correction method for microbolometer-type uncooled thermal detector focal plane arrays (FPAs) that suffer from pixel-to-pixel resistance variation, which is conventionally corrected by applying a specific bias voltage to each detector by the use on-chip DACs. The proposed method uses the heating of the detector with electrical bias, where the detector is heated-up for a pre-determined period of time before the read-out phase. The proposed method uses only a heat-up signal source and simple digital blocks for each column, eliminating the need for DACs that occupy large area, contribute to the noise floor of the system, and dissipate extra power. The proposed method provides a detector current resolution of 14.5 nA with 9-bit digital data, which corresponds to the resolution of 12-bit DAC used in conventional methods.

Paper Details

Date Published: 14 May 2007
PDF: 8 pages
Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 65423T (14 May 2007); doi: 10.1117/12.726570
Show Author Affiliations
Murat Tepegoz, Middle East Technical Univ. (Turkey)
Tayfun Akin, Middle East Technical Univ. (Turkey)

Published in SPIE Proceedings Vol. 6542:
Infrared Technology and Applications XXXIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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