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Proceedings Paper

PZT active health monitoring for fatigue accumulative damage of concrete beam containing nano-particles for pavement
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Paper Abstract

Based on the actuation and sense function of piezoceramic materials, PZT active health monitoring for fatigue accumulative damage of concrete beam containing nano-particles (TiO2) for pavement is experimentally studied. The test results indicate that the vibration signals received by PZT patches have three development stages obviously: the damage-formation stage, the damage-steady-growth stage and the damage-sharp-growth stage, which shows that PZT patch can monitor the whole course of the formation and growth of cracks in concrete and the failure of concrete beam. The fatigue damage index of concrete based on wavelet packet decomposition is established, and its change trend is similar to that of fatigue damage of concrete. In the range of 0%-10% of fatigue life, the damage index is approximately zero, which means that the concrete beam is basically in a healthy state and internal cracks are germinating. In the range of 10%-90% of fatigue life, the damage index increases from zero to a smaller value slowly, which means that the cracks in concrete propagate slowly. After the 90% of fatigue life, the damage index increases rapidly, which means that the cracks in concrete extend sharply and run through up to the fracture failure of concrete beam. The magnitude of damage index can show the serious extent of fatigue damage in concrete and the healthy status of concrete. The fatigue damage in concrete can be located by comparing the amplitude character of break signals or the change regularity of damage indices of PZT patches attached on concrete beam in different position. Moreover, the smaller the distance of PZT patch from the damage is, the more obvious the signal break and the change of damage index of PZT patch are, and the more sensitive the identification of PZT patch to the damage is.

Paper Details

Date Published: 5 March 2007
PDF: 12 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65952B (5 March 2007); doi: 10.1117/12.726464
Show Author Affiliations
Mao-hua Zhang, Harbin Institute of Technology (China)
Hui Li, Harbin Institute of Technology (China)
Jin-ping Ou, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III

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