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Proceedings Paper

Grain effect on imaging of spatial optical system
Author(s): Dakun Wu; Yanping Zhou; Song Guo
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Paper Abstract

The application of optical systems may be conveniently grouped into guidance applications, in which the position of a star, planet, or other body is sensed in order to maintain vehicle attitude and position; into surveillance applications, in which a view is maintained toward space to detect and track missiles, other space vehicles, or celestial bodies. When spacecraft moves around earth, volatile condensable material (VCM) recondensing on the surface of the window induces the degradation of optical performance. In order to insure spacecraft fulfilling its work successfully, space optical designers must think of sublimation, decomposition, and offgassing of materials in vacuum and the possible deposition of products from such actions onto optical surfaces. Still now, lots of antipollution works have been done. But little work is done to analyze VCM how to influence imaging. However, it not means that such work is not important. First of all, it is supposed that the VCM which looks like circle grain spreads on the surface of optical system equably. Then the point spread function (PSF) of optical system under kinds of contamination spread density is obtained. The result indicates that the envelope line of PSF widens. This means that the resolution of optical system will reduce, which induce low detection sensitivity. It is obtained that VCM leads not only low optical transmissivity but also worse imaging quality. And it is emphasized PSF effecting on imaging quality in this paper.

Paper Details

Date Published: 5 March 2007
PDF: 7 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659529 (5 March 2007); doi: 10.1117/12.726458
Show Author Affiliations
Dakun Wu, Harbin Institute of Technology (China)
Yanping Zhou, Harbin Institute of Technology (China)
Song Guo, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III

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