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Proceedings Paper

Conoscopic methods of optic crystal research
Author(s): Alexander V. Syuy; Vladimir I. Stroganov; Victor V. Krishtop; Vladimir V. Lihtin
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Paper Abstract

Since each year all are more grown different synthetic crystal since crystals find the most broad using in science and technology. Obviously, as important efficient and fine methods of the study and analysis crystal, including optical. The interference pictures play in optical method of the study crystal important role. At imposition two coherent bunches of the light with alike polarization appears the interference picture - a spatial interleaving maximum and minimum intensive. If coherent bunch are polarized mutually perpendicular, that interference picture does not appear, but result to interferences is a light circular or elliptical polarized. For observation of the interferences in this case necessary polarization interference bunch by means of analyzer to bring about one direction. The optical scheme is offered for observation conoscopic figures of the unusual type. They are received interference pictures with light bunch, having small angular divergence in the manner of parallel stripes, rings, ellipses. Experimental is determined border corner, under which occurs transition from standard conoscopic figure to quotient case. The optical spottiness exist on background conoscopic figures. As object of the study used the crystals LiNbO3, LiNbO3:Fe (0,3 %), LiNbO3:Ru (0,3%), LiNbO3:Fe+Cu (0,3+0,01 %), LiNbO3:Fe+Rh (0,3+0,01 %), LiJO3, Ba1-xSrxNb2,O6, KDP. Thicknesses crystal lies within the range of from 0,5 mm before 23 mm.

Paper Details

Date Published: 5 March 2007
PDF: 6 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65950E (5 March 2007); doi: 10.1117/12.726442
Show Author Affiliations
Alexander V. Syuy, Far Eastern State Transport Univ. (Russia)
Vladimir I. Stroganov, Far Eastern State Transport Univ. (Russia)
Victor V. Krishtop, Far Eastern State Transport Univ. (Russia)
Vladimir V. Lihtin, Komsomolsk-on-Amur State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III

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