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Proceedings Paper

Real-time multicamera system for measurement of 3D coordinates by pattern projection
Author(s): Ventseslav Sainov; Elena Stoykova; Jana Harizanova
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Paper Abstract

The report describes a real-time pattern-projection system for measurement of 3D coordinates with simultaneous illumination and recording of four phase-shifted fringe patterns which are projected at four different wavelengths and captured by four synchronized CCD cameras. This technical solution overcomes the main drawback of the temporal phase-shifting profilometry in which the pattern acquisition is made successively in time. The work considers the use of a sinusoidal phase grating as a projection element which is made by analysis of the frequency content of the projected fringes in the Fresnel diffraction zone and by test measurements of relative 3D coordinates that are performed with interferometrically recorded sinusoidal phase gratings on holographic plates. Finally, operation of a four-wavelength profilometric system with four spatially phase-shifted at &pgr;/2 sinusoidal phase gratings illuminated with four diode lasers at wavelengths 790 nm, 810 nm, 850 nm and 910 nm is simulated and the systematical error of the profilometric measurement is evaluated.

Paper Details

Date Published: 18 June 2007
PDF: 11 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160A (18 June 2007); doi: 10.1117/12.726380
Show Author Affiliations
Ventseslav Sainov, Central Lab. of Optical Storage and Processing of Information (Bulgaria)
Elena Stoykova, Central Lab. of Optical Storage and Processing of Information (Bulgaria)
Jana Harizanova, Central Lab. of Optical Storage and Processing of Information (Bulgaria)


Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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