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Proceedings Paper

Multi-resolution optical 3D sensor
Author(s): Peter Kühmstedt; Matthias Heinze; Ingo Schmidt; Martin Breitbarth; Gunther Notni
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Paper Abstract

A new multi resolution self calibrating optical 3D measurement system using fringe projection technique named "kolibri FLEX multi" will be presented. It can be utilised to acquire the all around shape of small to medium objects, simultaneously. The basic measurement principle is the phasogrammetric approach /1,2,3/ in combination with the method of virtual landmarks for the merging of the 3D single views. The system consists in minimum of two fringe projection sensors. The sensors are mounted on a rotation stage illuminating the object from different directions. The measurement fields of the sensors can be chosen different, here as an example 40mm and 180mm in diameter. In the measurement the object can be scanned at the same time with these two resolutions. Using the method of virtual landmarks both point clouds are calculated within the same world coordinate system resulting in a common 3D-point cloud. The final point cloud includes the overview of the object with low point density (wide field) and a region with high point density (focussed view) at the same time. The advantage of the new method is the possibility to measure with different resolutions at the same object region without any mechanical changes in the system or data post processing. Typical parameters of the system are: the measurement time is 2min for 12 images and the measurement accuracy is below 3&mgr;m up to 10 &mgr;m. The flexibility makes the measurement system useful for a wide range of applications such as quality control, rapid prototyping, design and CAD/CAM which will be shown in the paper.

Paper Details

Date Published: 18 June 2007
PDF: 8 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161K (18 June 2007); doi: 10.1117/12.726138
Show Author Affiliations
Peter Kühmstedt, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Matthias Heinze, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Ingo Schmidt, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Martin Breitbarth, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Gunther Notni, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)


Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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