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Proceedings Paper

3D shape measurement with phase correlation based fringe projection
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Paper Abstract

Here we propose a method for 3D shape measurement by means of phase correlation based fringe projection in a stereo arrangement. The novelty in the approach is characterized by following features. Correlation between phase values of the images of two cameras is used for the co-ordinate calculation. This work stands in contrast to the sole usage of phase values (phasogrammetry) or classical triangulation (phase values and image co-ordinates - camera raster values) for the determination of the co-ordinates. The method's main advantage is the insensitivity of the 3D-coordinates from the absolute phase values. Thus it prevents errors in the determination of the co-ordinates and improves robustness in areas with interreflections artefacts and inhomogeneous regions of intensity. A technical advantage is the fact that the accuracy of the 3D co-ordinates does not depend on the projection resolution. Thus the achievable quality of the 3D co-ordinates can be selectively improved by the use of high quality camera lenses and can participate in improvements in modern camera technologies. The presented new solution of the stereo based fringe projection with phase correlation makes a flexible, errortolerant realization of measuring systems within different applications like quality control, rapid prototyping, design and CAD/CAM possible. In the paper the phase correlation method will be described in detail. Furthermore, different realizations will be shown, i.e. a mobile system for the measurement of large objects and an endoscopic like system for CAD/CAM in dental industry.

Paper Details

Date Published: 18 June 2007
PDF: 9 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160B (18 June 2007); doi: 10.1117/12.726119
Show Author Affiliations
Peter Kühmstedt, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Christoph Munckelt, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Matthias Heinze, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Christian Bräuer-Burchardt, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)
Gunther Notni, Fraunhofer-Institute for Applied Optics and Precision Engineering, Jena (Germany)


Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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