Share Email Print
cover

Proceedings Paper

Robust Shack-Hartmann wavefront sensing with ultraflat microaxicons
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Recently developed Shack-Hartmann sensors with axicon beam shapers show an enhanced robustness compared to setups with spherical microlenses. With ultraflat axicon arrays, further improvements were obtained. Very extended, fringeless nondiffracting beams or "needle beams" with self-reconstructing properties can be produced. Specific advantages of thin-film structures like low dispersion and reflective operation can be implemented. Here we report on first systematic studies of angular tolerance and displacement sensitivity of different types of refractive, reflective and diffractive Shack-Hartmann devices. A quantitative description of the functionality is given on the basis of higher order spatial statistical moments. This method enables for identifying optimum parameter ranges to determine wavefront curvatures under extreme conditions.

Paper Details

Date Published: 18 June 2007
PDF: 12 pages
Proc. SPIE 6617, Modeling Aspects in Optical Metrology, 66170O (18 June 2007); doi: 10.1117/12.726081
Show Author Affiliations
R. Grunwald, Max-Born Institute for Nonlinear Optics and Ultrafast Spectroscopy (Germany)
M. Bock, Max-Born Institute for Nonlinear Optics and Ultrafast Spectroscopy (Germany)
S. Huferath, Bremen Institute of Applied Beam Technology (Germany)


Published in SPIE Proceedings Vol. 6617:
Modeling Aspects in Optical Metrology
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

© SPIE. Terms of Use
Back to Top