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Proceedings Paper

Special lenslet array with long focal length range for Shack-Hartmann Wavefront Sensor
Author(s): L. P. Zhao; N. Bai; X. Li; Z. P. Fang; A. A. Hein; Z. W. Zhong
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Paper Abstract

Since its emergence in the early 1970s, Shack-Hartmann Wavefront Sensing technology has been investigated and explored world-widely by the researchers and engineers. However, there are few papers or reports to study the system performance and key factors to affect the performance of a Shack-Hartmann Wavefront Sensor (SHWS), in this paper, through experimental study of the system stability of a SHWS, it is found that the image sensor and detector, normally a CCD, should be placed exactly at the focal plane of the lenslet array, otherwise it will bring in significant wavefront measurement error. In order to improve the system performance, a special lenslet array with long focal range is designed, and it is functioned by a spatial light modulator for sampling wavefront in a SHWS. Diffractive lenses with long focal length range can provide pseudo-nondiffracting beams, and a long range of focusing plane. The performances and effects of the modified SHWS with such a special lenslet array generated by a programmable SLM, are investigated, and the experimental results show that the system stability and measurement repeatability are not sensitive to the sensing distance, and can keep at a good level in a long range.

Paper Details

Date Published: 18 June 2007
PDF: 6 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161O (18 June 2007); doi: 10.1117/12.726043
Show Author Affiliations
L. P. Zhao, Singapore Institute of Manufacturing Technology (Singapore)
N. Bai, Singapore Institute of Manufacturing Technology (Singapore)
X. Li, Singapore Institute of Manufacturing Technology (Singapore)
Z. P. Fang, Singapore Institute of Manufacturing Technology (Singapore)
A. A. Hein, Nanyang Technological Univ. (Singapore)
Z. W. Zhong, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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