Share Email Print

Proceedings Paper

Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera
Author(s): Y. Arai; R. Shimamura; S. Yokozeki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A high resolution new fringe analysis method for ESPI with only one camera is proposed by using features of speckle interferometry in deformation process. The profile of intensity of each speckle of speckle patterns in the deformation process is analyzed by Hilbert transformation. A virtual speckle pattern for creating a carrier fringe image is produced artificially. The deformation map can be detected by the virtual speckle pattern in the operation based on spatial fringe analysis method. Experimental results show that the difference between the results by the new and the ordinary methods is less than 0.12 rad as standard deviation.

Paper Details

Date Published: 18 June 2007
PDF: 8 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 661611 (18 June 2007); doi: 10.1117/12.726018
Show Author Affiliations
Y. Arai, Kansai Univ. (Japan)
R. Shimamura, Kansai Univ. (Japan)
S. Yokozeki, Jyokou Applied Optics Lab. (Japan)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top