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Proceedings Paper

Example of using small falling weight deflectomer (FWD) for Earth structures and low cost road pavement in Japan
Author(s): Hideaki Shibata; Yasutomo Tanaka; Isamu Ono; Tsuyoshi Okano
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Paper Abstract

The FWD (Falling Weight Deflectometer) is an instrument which makes the weight fall freely on its loading plate to apply impact load and measures the displacement caused by the fall at the center of impact load and also at the points in radial direction from the center of impact load. A kind of instrument which is mounted on or drawn by a vehicle used for construction of concrete pavement or asphalt pavement of a runway is usually called FWD. The impact load of FWD is 49KN to 196kN and it can obtain the modulus of elasticity of each pavement layer by back analysis based on the theory of multi-layer elasticity using 6 to 8 of extemal displacement sensors. On the other hand, the small FWD is an FWD which is constructed small and easy and is applicable for hand carry. It makes the weight fall freely on the loading plate to apply impact load and measures the load and displacement caused by the fall. It was developed for mainly assessing the rigidity and bearing capacity of the subgrade easily and promptly. It can measure many points in short term and obtain coefficient of subgrade reaction and modulus of subgrade elasticity without using reaction facilities like as plate bearing test or CBR test. It has also been tried to apply the small FWD to low cost asphalt road pavement (later called as low cost road pavement). Application examples of small FWD test for earth structure and low cost load pavement in Japan are shown and the methods and test results are stated in this report.

Paper Details

Date Published: 5 March 2007
PDF: 8 pages
Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65951M (5 March 2007); doi: 10.1117/12.725809
Show Author Affiliations
Hideaki Shibata, Kokushikan Univ. (Japan)
Yasutomo Tanaka, Kokushikan Univ. (Japan)
Isamu Ono, Kokushikan Univ. (Japan)
Tsuyoshi Okano, Tokyosokkikenkyujo Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 6595:
Fundamental Problems of Optoelectronics and Microelectronics III
Yuri N. Kulchin; Jinping Ou; Oleg B. Vitrik; Zhi Zhou, Editor(s)

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