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Proceedings Paper

Terahertz multiwavelength phase imaging without 2π ambiguity
Author(s): Yan Zhang; Liangliang Zhang; Cunlin Zhang
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Paper Abstract

Terahertz (THz) imaging technology is now becoming a very important technology for the applications of the THz electromagnetic wave. The good imaging method can provide more information about the object to be investigated. A new terahertz phase imaging method with multi-wavelengths is proposed in this presentation. This novel approach can image object with larger optical length compared to the largest wavelength in the terahertz spectrum and does not involve the usual phase unwrapping in the detection of phase discontinuity. Furthermore, this technique can also effectively reduce the noise background. Two examples are presented to demonstrate the validity of this new method. It was shown that the multi-wavelengths phase imaging is a straightforward and efficient phase data processing method in terahertz imaging application.

Paper Details

Date Published: 18 June 2007
PDF: 7 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66163L (18 June 2007); doi: 10.1117/12.725787
Show Author Affiliations
Yan Zhang, Capital Normal Univ. (China)
Liangliang Zhang, Capital Normal Univ. (China)
Cunlin Zhang, Capital Normal Univ. (China)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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