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Proceedings Paper

S-transform analysis of projected fringe patterns
Author(s): Özlem Kocahan; Serhat Özder; Emre Coşkun
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Paper Abstract

3D profile measurement of an object is studied experimentally by using a standard fringe projection technique consisting of a CCD camera and a digital projector. The height profile of the object is calculated through the phase change distribution of the projected fringes with two dimensional fringe pattern by introducing the carrier frequencies in two spatial directions, x and y. The phase distribution is extracted from the optical fringe pattern by using S-transform gradient and S-transform phase methods. Experimental result for the Fourier transform profilometry algorithm is compared with the results of the S-transform analysis.

Paper Details

Date Published: 18 June 2007
PDF: 6 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161A (18 June 2007); doi: 10.1117/12.725786
Show Author Affiliations
Özlem Kocahan, Çanakkale Onsekiz Mart Univ. (Turkey)
Serhat Özder, Çanakkale Onsekiz Mart Univ. (Turkey)
Emre Coşkun, Çanakkale Onsekiz Mart Univ. (Turkey)

Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

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