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Proceedings Paper

Measurements of laser-induced damage thresholds for KGSS 0180 neodymium glass surface
Author(s): V. S. Sirazetdinov; D. I. Dmitriev; I. V. Ivanova; V. N. Pasunkin; A. V. Charukhchev
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Paper Abstract

Dependences of energy damage thresholds on radiation parameters and geometry for KGSS 0180 phosphate neodymium glass have been studied. Laser induced damage threshold dependences on the pulse duration for the range of 1.5-20 ns for KGCC 0180 and K8 glasses are: εkgss = 16 x τ1/2 И εK8 = 18 x τ1/2(J/cm2, when τ in nanoseconds). Damage thresholds for the entrance and exit surfaces of KGSS 0180 glass samples have been measured when the samples were irradiated by a P-polarized beam at Brewster's angle: εent ≈ 48J/cm2; εex ≈ 31 J/cm2. It has also been found out that the threshold energy density of the beam in case of Brewster's incidence to the exit surface of the sample is almost 1.5 times lower than in the case of a normal incidence. At the same time the relation is reverse for the entrance surface of the glass KGSS 0180 sample with the same radiation polarization.

Paper Details

Date Published: 11 January 2007
PDF: 10 pages
Proc. SPIE 6594, Lasers for Measurements and Information Transfer 2006, 65940P (11 January 2007); doi: 10.1117/12.725612
Show Author Affiliations
V. S. Sirazetdinov, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
D. I. Dmitriev, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
I. V. Ivanova, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. N. Pasunkin, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
A. V. Charukhchev, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)


Published in SPIE Proceedings Vol. 6594:
Lasers for Measurements and Information Transfer 2006

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