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Proceedings Paper

Testing of KGSS-0180 laser glass for platinum micro-inclusions
Author(s): D. I. Dmitriev; V. I. Arbuzov; K. V. Dukelsky; A. A. Zhilin; I. V. Ivanova; V. N. Pasunkin; Yu. I. Pestov; V. S. Sirazetdinov; A. V. Charukhchev; V. S. Shashkin
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Paper Abstract

Testing techniques for detection of platinum micro-inclusions in the laser glass have been developed. Over 70 KGSS 0180 glass samples totaling ~ 400 cm3 have been tested. It has been shown that platinum-induced damage was absent only in 25% of glass melts out of the entire tested amount. An averaged concentration of inclusions was Npt ~ 5 liter-1. Concentration of micro-inclusions in the last KGSS 0180 batch is ~ 1÷2 liter-1. To automate and reduce testing time for the entire blank volume of the active disc element (4-6 liters) an automated system for mapping Pt-inclusions during irradiation has been developed. The efficiency of the proposed QC methods has been demonstrated experimentally.

Paper Details

Date Published: 11 January 2007
PDF: 8 pages
Proc. SPIE 6594, Lasers for Measurements and Information Transfer 2006, 65940N (11 January 2007); doi: 10.1117/12.725605
Show Author Affiliations
D. I. Dmitriev, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. I. Arbuzov, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
K. V. Dukelsky, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
A. A. Zhilin, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
I. V. Ivanova, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. N. Pasunkin, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
Yu. I. Pestov, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. S. Sirazetdinov, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
A. V. Charukhchev, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)
V. S. Shashkin, Research Institute for Complex Testing of Opto-Electronic Devices (Russia)


Published in SPIE Proceedings Vol. 6594:
Lasers for Measurements and Information Transfer 2006

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