Share Email Print
cover

Proceedings Paper

Projected fringe profilometry of a high speed moving object using a time delay and integration imaging
Author(s): Yanming Chen; Yuming He; Eryi Hu; Changhong Ai
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel technique is presented for measurement of surface profile, dynamic inspection of surface quality and nondestructive detection of a motion object at highly constant speed in this paper. In practice, a sinusoidal grating pattern with a common LCD projector is projected onto a moving object. Then, grating patterns which are deformed according to the object shape are acquired by a CCD camera operating in time delay and integration (TDI) mode. When the charges in TDI camera are shifted row by row at a specified speed which is the same as the object speed, a clear and bright image is easily obtained. Because of this advantage in the application of TDI camera, it is proved to be an effective and straightforward approach to avoid blurred image in high speed 3D projection grating patterns profilometry. In our experiment, Fourier transform algorithm is used for projected fringe profilometry. Upon that, absolute 3D surface profile is perfectly achieved. Finally, several factors which will induce measurement errors are respectively discussed, such as the speed disharmony between the object and TDI charges transfer and orientation disorder between the fringe pattern and motion object.

Paper Details

Date Published: 29 January 2007
PDF: 7 pages
Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794Z (29 January 2007); doi: 10.1117/12.725571
Show Author Affiliations
Yanming Chen, Huazhong Univ. of Science and Technology (China)
Yuming He, Huazhong Univ. of Science and Technology (China)
Eryi Hu, Huazhong Univ. of Science and Technology (China)
Changhong Ai, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6279:
27th International Congress on High-Speed Photography and Photonics

© SPIE. Terms of Use
Back to Top