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Proceedings Paper

High-speed phase shifting profilometry with dual-frequency digital projection grating pattern
Author(s): Yanming Chen; Yuming He; Eryi Hu; Hongmao Zhu
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Paper Abstract

An investigation of optical shape and profile measurement technique with respect to dual-frequency digital projection grating pattern is presented in this paper. Two gratings with different frequencies are respectively projected onto an object for the extension of the unambiguity range. And then, grating patterns which are deformed according to the object shape are acquired by a CCD camera. The 3D shape of object surface is reconstructed by using dual-frequency-combination phase-shifting profilometry (PSP) algorithm which is especially presented. Several advantages of using new algorithm instead of other traditional approaches are adequately discussed in practical measurement. Comparing to either conventional PSP or dual frequency PSP, dual-frequency-combination PSP has speediness advantage because of no phase unwrapping process and other additive processes. Furthermore, the analysis proves that the variance of phase in dual-frequency-combination PSP is much steadier than that in dual-frequency PSP. Finally experimental results demonstrated the feasibility of this technique for high-speed surface profile measurement.

Paper Details

Date Published: 29 January 2007
PDF: 7 pages
Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 62794Y (29 January 2007); doi: 10.1117/12.725569
Show Author Affiliations
Yanming Chen, Huazhong Univ. of Science and Technology (China)
Yuming He, Huazhong Univ. of Science and Technology (China)
Eryi Hu, Huazhong Univ. of Science and Technology (China)
Hongmao Zhu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6279:
27th International Congress on High-Speed Photography and Photonics

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