Share Email Print
cover

Proceedings Paper

Theoretical and numerical investigations of fused silica modification using ultrafast double-pulses
Author(s): Qing Liu; Jianjun Wang; Guanghua Cheng; Junjun Chen; Feifei Liu; Changqing Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We study the mechanisms of ultrafast free-electron generation in laser-irradiated dielectrics (fused silica). The evolution of the free-electron density in the conduction band of dielectrics irradiated by ultrafast double-pulses laser is calculated. The effects of the avalanche ionization is calculated with the recently introduced multiple rate equation, which keeps track of the energy distribution of the free electrons, while maintaining the conceptual and analytic simplicity of the standard rate equation. Using temporally shaped pulse trains with picosecond separation leads to a significant improvement in the quality of ultrafast laser micro-structuring of dielectrics. The evolution of the free-electron density in fused silica irradiated by tightly focused 100 fs laser double-pulses at a center wavelength of 800 nm are numerically investigated to study the role of nonlinear photo-ionization and avalanche ionization processes in free electron generation. The role of impact ionization as compared to photoionization is analyzed.

Paper Details

Date Published: 29 January 2007
PDF: 7 pages
Proc. SPIE 6279, 27th International Congress on High-Speed Photography and Photonics, 627947 (29 January 2007); doi: 10.1117/12.725370
Show Author Affiliations
Qing Liu, Zhejiang Wanli Univ. (China)
Jianjun Wang, Zhejiang Wanli Univ. (China)
Guanghua Cheng, Xi'an Institute of Optics and Precision Mechanics (China)
Junjun Chen, Zhejiang Wanli Univ. (China)
Feifei Liu, Zhejiang Wanli Univ. (China)
Changqing Liu, Ningxia Univ. (China)


Published in SPIE Proceedings Vol. 6279:
27th International Congress on High-Speed Photography and Photonics

© SPIE. Terms of Use
Back to Top