Share Email Print
cover

Proceedings Paper

New features of Doppler-free saturated-absorption resonance in field of counterpropagating waves
Author(s): Denis V. Brazhnikov; Alexey V. Taichenachev; Anatoliy M. Tumaikin; Valeriy I. Yudin; Sergei A. Zibrov; Yaroslav O. Dudin; Peter A. Siushev; Alexander G. Radnaev; Vitaliy V. Vasil'ev; Vladimir L. Velichansky
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The resonance of saturated absorption in counterpropagating light fields is experimentally and theoretically studied. We focus on two cases: parallel and linearly polarized waves, driving an open dipole transition and the general case of elliptically polarized waves, driving closed dipole transition. The former reveals a new Doppler-free resonance as a peak within the saturated-absorption dip. The latter case reveals a new polarization effect, causing a shift and asymmetry of the saturated-absorption resonance. The results obtained can be found useful in metrology.

Paper Details

Date Published: 18 June 2007
PDF: 8 pages
Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161I (18 June 2007); doi: 10.1117/12.725127
Show Author Affiliations
Denis V. Brazhnikov, Institute of Laser Physics (Russia)
Alexey V. Taichenachev, Institute of Laser Physics (Russia)
Novosibirsk State Univ. (Russia)
Anatoliy M. Tumaikin, Institute of Laser Physics (Russia)
Valeriy I. Yudin, Institute of Laser Physics (Russia)
Novosibirsk State Univ. (Russia)
Sergei A. Zibrov, Lebedev Physical Institute (Russia)
Yaroslav O. Dudin, Lebedev Physical Institute (Russia)
Peter A. Siushev, Lebedev Physical Institute (Russia)
Alexander G. Radnaev, Lebedev Physical Institute (Russia)
Vitaliy V. Vasil'ev, Lebedev Physical Institute (Russia)
Vladimir L. Velichansky, Lebedev Physical Institute (Russia)


Published in SPIE Proceedings Vol. 6616:
Optical Measurement Systems for Industrial Inspection V
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top