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Proceedings Paper

Calibration of a phase-shifting DIC microscope for quantitative phase imaging
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Paper Abstract

Phase-shifting differential interference contrast (DIC) provides images in which the intensity of DIC is transformed into values linearly proportional to differential phase delay. Linear regression analysis of the Fourier space, spiral phase, integration technique shows these values can be integrated and calibrated to provide accurate phase measurements of objects embedded in optically transparent media regardless of symmetry or absorption properties. This approach has the potential to overcome the limitations of profilometery, which cannot access embedded objects, and extend the capabilities of the traditional DIC microscope, which images embedded phase objects, but does not provide quantitative information.

Paper Details

Date Published: 14 February 2007
PDF: 12 pages
Proc. SPIE 6443, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIV, 64430M (14 February 2007); doi: 10.1117/12.725061
Show Author Affiliations
Sharon V. King, Univ. of Colorado, Boulder (United States)
Ariel R. Libertun, Univ. of Colorado, Boulder (United States)
Chrysanthe Preza, Univ. of Memphis (United States)
Carol J. Cogswell, Univ. of Colorado, Boulder (United States)
CDM Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 6443:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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