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Proceedings Paper

Multilayers for next-generation x-ray sources
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Paper Abstract

Multilayers are artificially layered structures that can be used to create optics and optical elements for a broad range of x-ray wavelengths, or can be optimized for other applications. The development of next generation x-ray sources (high brightness synchrotrons and x-ray free electron lasers) requires advances in x-ray optics. Newly developed multilayer-based mirrors and optical elements enabled efficient band-pass filtering, focusing and time resolved measurements in recent FLASH (Free Electron LASer in Hamburg) experiments. These experiments are providing invaluable feedback on the response of the multilayer structures to high intensity, short pulsed x-ray sources. This information is crucial to design optics for future x-ray free electron lasers and to benchmark computer codes that simulate damage processes.

Paper Details

Date Published: 18 May 2007
PDF: 10 pages
Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860J (18 May 2007); doi: 10.1117/12.724786
Show Author Affiliations
S. Bajt, Lawrence Livermore National Lab. (United States)
H. N. Chapman, Lawrence Livermore National Lab. (United States)
E. Spiller, Spiller X-ray Optics (United States)
S. Hau-Riege, Lawrence Livermore National Lab. (United States)
J. Alameda, Lawrence Livermore National Lab. (United States)
A. J. Nelson, Lawrence Livermore National Lab. (United States)
C. C. Walton, Lawrence Livermore National Lab. (United States)
B. Kjornrattanawanich, Universities Space Research Assoc. (United States)
A. Aquila, Lawrence Berkeley National Lab. (United States)
F. Dollar, Lawrence Berkeley National Lab. (United States)
E. Gullikson, Lawrence Berkeley National Lab. (United States)
C. Tarrio, National Institute of Standards and Technology (United States)
S. Grantham, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 6586:
Damage to VUV, EUV, and X-ray Optics
Libor Juha; Ryszard H. Sobierajski; Hubertus Wabnitz, Editor(s)

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