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Proceedings Paper

Impact of self-heating in LF noise measurements with voltage amplifiers
Author(s): A. A. Lisboa de Souza; J.-C. Nallatamby; M. Prigent; J. Obregon
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Paper Abstract

Voltage Amplifiers have been used to characterize the low-frequency noise of Heterojunction Bipolar Transistors (HBTs). They generally feature not only a lower noise floor, but also have less impact on simultaneous (two-port) measurements than Transimpedance Amplifiers, when moderate to high DC current regimes are considered. However, when the Device Under Test (DUT) is characterized under these regimes, common concepts such as unilateralism and frequency-independent small-signal parameters are no longer valid due to the frequency-dependent thermal response of the DUT (self-heating). It will be shown that depending on the conditions under which the measurements are carried out, the experimental data may vary for some orders of magnitude, leading to an incorrect characterization if the effect is disregarded.

Paper Details

Date Published: 11 June 2007
PDF: 7 pages
Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 660018 (11 June 2007); doi: 10.1117/12.724665
Show Author Affiliations
A. A. Lisboa de Souza, XLIM, CNRS (France)
J.-C. Nallatamby, XLIM, CNRS (France)
M. Prigent, XLIM, CNRS (France)
J. Obregon, XLIM, CNRS (France)


Published in SPIE Proceedings Vol. 6600:
Noise and Fluctuations in Circuits, Devices, and Materials
Massimo Macucci; Lode K.J. Vandamme; Carmine Ciofi; Michael B. Weissman, Editor(s)

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