Share Email Print

Proceedings Paper

Noise characteristics and reliability of light emitting diodes based on nitrides
Author(s): S. Pralgauskaitė; V. Palenskis; J. Matukas; J. Petrulis; G. Kurilčik
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical and electrical noises and correlation factor between optical and electrical fluctuations of nitride-based light emitting diodes (LEDs) have been investigated under forward bias. Their electrical, optical and noise characteristics were compared with ones of LEDs of other materials. LED noise characteristic changes during aging have been measured, too. It is found that optical and electrical noise spectra under forward bias for more reliable LEDs distinguish by lower 1/f type fluctuations and Lorentzian type noise at higher frequencies. LEDs with intensive 1/f noise demonstrate shorter lifetime. It is shown that reason of LED degradation is related with defects presence in device structure. These defects can be formed during device fabrication or appear during operation. An analysis of LED current-voltage and electrical noise characteristics under forward and reverse bias has shown that LEDs with intensive 1/f electrical noise, large reverse current (low reverse breakdown voltage) and larger terminal voltage under forward bias distinguish by short lifetime.

Paper Details

Date Published: 11 June 2007
PDF: 10 pages
Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66001H (11 June 2007); doi: 10.1117/12.724538
Show Author Affiliations
S. Pralgauskaitė, Vilnius Univ. (Lithuania)
V. Palenskis, Vilnius Univ. (Lithuania)
J. Matukas, Vilnius Univ. (Lithuania)
J. Petrulis, Vilnius Univ. (Lithuania)
G. Kurilčik, Vilnius Univ. (Lithuania)

Published in SPIE Proceedings Vol. 6600:
Noise and Fluctuations in Circuits, Devices, and Materials
Massimo Macucci; Lode K.J. Vandamme; Carmine Ciofi; Michael B. Weissman, Editor(s)

© SPIE. Terms of Use
Back to Top