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Proceedings Paper

Application of planar waveguides with gradient index profile to determine parameters of thin active layers used in waveguide sensors
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Paper Abstract

The presence of thin cover layer on planar waveguide influences its propagation characteristics. A generalized m-line spectroscopy method enables the evaluation of the parameters (the refractive index, n and the thickness, t) of the subguiding layers deposited on a planar waveguide. In this paper algorithm for determination of the parameters of the thin layer (deposited on waveguide with previously evaluated index profile by m-line method) has been presented.

Paper Details

Date Published: 16 May 2007
PDF: 10 pages
Proc. SPIE 6585, Optical Sensing Technology and Applications, 65852D (16 May 2007); doi: 10.1117/12.724528
Show Author Affiliations
Elzbieta Augusciuk, Warsaw Univ. of Technology (Poland)
Filip Sala, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 6585:
Optical Sensing Technology and Applications
Francesco Baldini; Jiri Homola; Robert A. Lieberman; Miroslav Miler, Editor(s)

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