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Proceedings Paper

Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies
Author(s): M. De Grazia; H. Merdji; B. Carré; J. Gaudin; G. Geoffroy; S. Guizard; N. Fedorov; A. Belsky; P. Martin; M. Kirm; V. Babin; E. Feldbach; S. Vielhauer; V. Nagirnyi; A. Vassil'ev; F. Krejci; J. Kuba; J. Chalupsky; J. Cihelka; V. Hajkova; M. Ledinský; L. Juha
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Paper Abstract

The new XUV sources, which deliver spatially coherent pulses of high peak power, allow to study elementary processes in the light/solid interaction in the high intensity regime (⩾1011W/cm2). Here, we report two studies which have used high-order laser harmonics (HH) generated in gas as the excitation source. Firstly, we have investigated the dynamics of electron relaxation in the wide gap CdWO4 dielectric crystal, an efficient scintillator material, using time-resolved luminescence spectroscopy. The kinetics decay of luminescence shows evidence of non radiative relaxation of the self-trapped excitons at the &mgr;s damage to surfaces of poly(methyl methacrylate) - PMMA, induced by a multi-shot XUV-irradiation (1 kHz reprate) for given fluence, below damage threshold range of ≈mJ/cm2. The main processes participating in the surface modification, polymer chain scission followed by the blow up of the volatile, molecular fragments and cross-linking in the near-surface layer of remaining material, are tentatively identified and associated to, crater formation for short-time exposure (< 1min) and surface hardening for long-time exposure (⩾1min).

Paper Details

Date Published: 15 June 2007
PDF: 10 pages
Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860I (15 June 2007); doi: 10.1117/12.724006
Show Author Affiliations
M. De Grazia, SPAM, CEA-Saclay (France)
H. Merdji, SPAM, CEA-Saclay (France)
B. Carré, SPAM, CEA-Saclay (France)
J. Gaudin, LSI, CEA, Ecole Polytechnique (France)
G. Geoffroy, LSI, CEA, Ecole Polytechnique (France)
S. Guizard, LSI, CEA, Ecole Polytechnique (France)
N. Fedorov, CELIA, CEA-CNRS, Univ. de Bordeaux I (France)
A. Belsky, CELIA, CEA-CNRS, Univ. de Bordeaux I (France)
P. Martin, CELIA, CEA-CNRS, Univ. de Bordeaux I (France)
M. Kirm, Univ. of Tartu (Estonia)
V. Babin, Univ. of Tartu (Estonia)
E. Feldbach, Univ. of Tartu (Estonia)
S. Vielhauer, Univ. of Tartu (Estonia)
V. Nagirnyi, Univ. of Tartu (Estonia)
A. Vassil'ev, Moscow Lomonosov Univ. (Russia)
F. Krejci, Czech Technical Univ. in Prague (Czech Republic)
J. Kuba, Czech Technical Univ. in Prague (Czech Republic)
J. Chalupsky, Czech Technical Univ. in Prague (Czech Republic)
Institute of Physics (Czech Republic)
J. Cihelka, Institute of Physics (Czech Republic)
V. Hajkova, Institute of Physics (Czech Republic)
M. Ledinský, Institute of Physics (Czech Republic)
L. Juha, Institute of Physics (Czech Republic)

Published in SPIE Proceedings Vol. 6586:
Damage to VUV, EUV, and X-ray Optics
Libor Juha; Ryszard H. Sobierajski; Hubertus Wabnitz, Editor(s)

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