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Proceedings Paper

Non-Gaussian noise in quantum wells
Author(s): A. Ben Simon; Y. Paltiel; G. Jung; H. Schneider
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Paper Abstract

Gaussian generation-recombination is accepted to be a dominant mechanism of current noise source in quantum well systems biased by electric field normal to the layers. Recent experiments in n-type and p-type multiple quantum wells have revealed an additional pronouncedly non-Gaussian excess current noise with a low cut-off frequency in the kHz range. The non-Gaussian noise has been attributed to metastable spatial configurations of electric field. The metastability is originating from negative differential conductance caused by intervalley scattering in n-type wells and heavy and light holes tunneling in p-type wells. At a constant bias the system randomly switches between high resistivity state with low current flow and low resistive state with high current. The non-Gaussianity of the noise is more pronounced in p-type wells where the time traces of current fluctuations resemble closely two-level random telegraph signal. In n-type wells the telegraph-like fluctuations have not been straightforwardly observed. The non-Gaussianity of the noise in n-type systems has been revealed by nonzero skewness. The differences between noise properties of between n- and p-type systems have been attributed to small capture probability of electrons in n-type wells, as opposed to very high capture probability of holes in p-type wells. As a consequence the noise of any p-type multi-well system is dominated by the tunneling from the wells while in the n-type the noise appears as a superposition of many fluctuators associated with individual wells.

Paper Details

Date Published: 22 June 2007
PDF: 12 pages
Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66000U (22 June 2007); doi: 10.1117/12.723611
Show Author Affiliations
A. Ben Simon, Soreq NRC (Israel)
Ben Gurion Univ. of the Negev (Israel)
Y. Paltiel, Soreq NRC (Israel)
G. Jung, Ben Gurion Univ. of the Negev (Israel)
H. Schneider, Institute of Ion-Beam Physics and Materials Research, Forschungszentrum Dresden Rossendorf (Germany)

Published in SPIE Proceedings Vol. 6600:
Noise and Fluctuations in Circuits, Devices, and Materials
Massimo Macucci; Lode K.J. Vandamme; Carmine Ciofi; Michael B. Weissman, Editor(s)

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