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Proceedings Paper

Measurement of modulation transfer function of infrared optoelectronic detector
Author(s): Lei Liu; Bing Chen
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Paper Abstract

This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.

Paper Details

Date Published: 31 May 2007
PDF: 6 pages
Proc. SPIE 6585, Optical Sensing Technology and Applications, 658525 (31 May 2007); doi: 10.1117/12.723336
Show Author Affiliations
Lei Liu, Nanjing Univ. of Science and Technology (China)
Bing Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6585:
Optical Sensing Technology and Applications
Francesco Baldini; Jiri Homola; Robert A. Lieberman; Miroslav Miler, Editor(s)

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